少子寿命扫描仪

型号:LL 156/300

LL156/300 用于更快更经济的评估材料的质量。此款小型仪器可以确保稳定的晶片质量。它具有如下特点:
-测试少子寿命,光电导,电阻率
-无接触 无损伤
-多晶硅锭二维绘制系统
-测量时间: 双面同时测量2分钟
-四面同时处理: 5 - 6 分钟
-分辨率 1 毫米

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