The LL 156/300 is designed to evaluate material quality quickly and economically. This handy machine helps to guarantee a steady quality of wafers

- Mapping of carrier lifetime, photoconductivity, resistivity
- Non-contact, non-destructive electrical semiconductor characterisation
- Two dimensional ingot mapping system for solar grade multi silicon
- Measurement time: 2 minutes for two surfaces simultaneously
- One ingot four sides with handling: 5 - 6 min
- Resolution 1 mm

Lifetime Scanner


By continuing to use this site, you agree to the use of cookies. more information

The cookie settings on this website are set to "allow cookies" to give you the best browsing experience possible. If you continue to use this website without changing your cookie settings, or you click "Accept" below then you are consenting to this.