BRICK LIFETIME SCANNING

The LL 156/300 is designed to evaluate material quality quickly and economically. This handy machine helps to guarantee a steady quality of wafers

- Mapping of carrier lifetime, photoconductivity, resistivity
- Non-contact, non-destructive electrical semiconductor characterisation
- Two dimensional ingot mapping system for solar grade multi silicon
- Measurement time: 2 minutes for two surfaces simultaneously
- One ingot four sides with handling: 5 - 6 min
- Resolution 1 mm

Lifetime Scanner

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